Features
Stable performance with easy operation
Compact semiconductor laser
Array CCD option for real-time data acquisition
Complete system
Introduction
The LEOI-30A apparatus is designed for the quantitative investigation of diffraction and interference effects. This system is capable of analyzing diffraction and interference patterns from a diffraction element with single-slit, multi-slit, and single-wire. It offers three options for the photo-receiving device, allowing users to select the most suitable method for data acquisition and analysis.
Option 1: A photo-cell with amplifier, which is used for manual data acquisition.
Option 2: A linear CCD for real-time data display on an oscilloscope, allowing for dynamic observation of diffraction intensity distribution.
Option 3: A linear CCD combined with a data acquisition (DAQ) box and software for PC-based data acquisition via USB, providing advanced features for analysis of diffraction intensity distribution.
Thanks to the fine pixel size (11 μm) and the large number of cells (2700) employed by the array CCD detector (options 2 & 3), a shorter rail (0.7 to 1 m) is adequate to acquire and resolve the entire diffraction pattern spatially, leading to a compact experimental configuration. Moreover, diffraction patterns can be acquired simultaneously and displayed with the array CCD detector in real-time, eliminating the need to turn a hand crank to scan across the diffraction pattern manually.
The instruction manual contains comprehensive materials including experimental configurations, principles and step-by-step instructions. Please click Experiment Theory and Contents to find more information about this apparatus.
Specifications
Optical Rail | length: 1.0 m | |
Semiconductor Laser | 3.0 mW @650 nm | |
Diffraction Element | Single-Slit | slit width: 0.07 mm, 0.10 mm, and 0.12 mm |
Single-Wire | diameter: 0.10 mm and 0.12 mm | |
Double-Slit | slit width 0.02 mm , central spacing 0.04 mm | |
Double-Slit | slit width 0.07 mm , central spacing 0.14 mm | |
Double-Slit | slit width 0.07 mm , central spacing 0.21 mm | |
Double-Slit | slit width 0.07 mm , central spacing 0.28 mm | |
Triple-Slit | slit width 0.02 mm , central spacing 0.04 mm | |
Quadruple-Slit | slit width 0.02 mm , central spacing 0.04 mm | |
Pentuple-Slit | slit width 0.02 mm , central spacing 0.04 mm | |
Photocell Detector (Option 1) | incl 0.1 mm reading ruler & amplifier, connected to a galvanometer | |
CCD (Option 2) | pixel number: 2700; size: 11×11 μm; spectral range: 0.3~0.9 μm | |
with synchronization/signal ports, connected to an oscilloscope | ||
CCD+DAQ+Software (Option 3) | incl Option 2 | |
DAQ and software for PC use via USB |