Physics Lab Equipment

LEOI-30A Measurement of Diffraction Intensity -Enhanced Model

LEOI-30A Measurement of Diffraction Intensity  -Enhanced Model

Note: oscilloscope not included

Features

  • Stable performance with easy operation

  • Compact semiconductor laser

  • CCD option

  • Complete system







Introduction

This apparatus is designed to quantitatively investigate diffraction and interference effects of single-slit, multi-slit, and single-wire. There are two options of the photo-receiving device, i.e. a photo-cell with amplifier (option 1) for manual data acquisition, a linear CCD (option 2) for real-time data display on an oscilloscope.


Specifications

Optical Rail length: 1.0 m
Semiconductor Laser 3.0 mW @650 nm

Diffraction

Element

Single-Slit slit width: 0.07 mm, 0.10 mm, and 0.12 mm
Single-Wire diameter: 0.10 mm and 0.12 mm
Double-Slit slit width 0.02 mm , central spacing 0.04 mm
Double-Slit slit width 0.07 mm , central spacing 0.14 mm
Double-Slit slit width 0.07 mm , central spacing 0.21 mm
Double-Slit slit width 0.07 mm , central spacing 0.28 mm
Triple-Slit slit width 0.02 mm , central spacing 0.04 mm
Quadruple-Slit slit width 0.02 mm , central spacing 0.04 mm
Pentuple-Slit slit width 0.02 mm , central spacing 0.04 mm
Photocell Detector (Option 1) With 0.1 mm reading ruler & amplifier, connected to galvanometer
CCD (Option 2) pixel number: 2700; size: 11×11 μm; spectral range: 0.3~0.9 μm
with synchronization/signal ports, connected to an oscilloscope


LEOI-30A Measurement-1.jpg

Data acquired and plotted manually


LEOI-30A Measurement-2.jpg

Graph observed on oscilloscope

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