Physics Lab Equipment

LEOI-31 Single-Wire/Single-Slit Diffraction

LEOI-31 Single-Wire/Single-Slit Diffraction

Features

  • Observe single-wire/single-slit diffraction

  • Measure intensity distribution of diffraction

  • Confirm relationship between intensity and wavelength

  • Obtain relationship between intensity and slit width

  • Verify Heisenberg uncertainty principle and Babinet's principle










Introduction

LEOI-31 employs a movable digital photoreceiver to measure the intensity distribution of optical diffraction. With a focus adjustable semiconductor laser, this system can be used to

 

1. observe single-wire/single-slit diffraction

2. measure intensity distribution of optical diffraction

3. confirm the relationship between intensity and wavelength

4. obtain the relationship between intensity and slit width

5. verify Heisenberg uncertainty and Babinet's principles


Specifications

Item Specifications
Semiconductor Laser 5 mW @ 650 nm
Diffractive Element Wire, and Single Slit (adjustable width)


Part List

Description Qty
Semiconductor Laser (LLL-1) 1
Optical Rail 1
Carrier 2
White Screen (SZ-13) 1

Single-Slit with Adjustable Width (SZ-40)

1

Two-Axis Adjustable Laser Holder (SZ-19)

1
Photoreceiver with Amplifier 1 each
Transverse Measurement Holder 1




LEOI-31 Single-Wire-1.jpg

Fraunhofer diffraction of single slit


Copyright © Lambda Scientific Systems, Inc. 2010-2017. All rights reserved.