Physics Lab Equipment

LEOI-31 Single-Wire/Single-Slit Diffraction

LEOI-31 Single-Wire/Single-Slit Diffraction

Features

  • Observe single-wire/single-slit diffraction

  • Measure intensity distribution of diffraction

  • Confirm relationship between intensity and wavelength

  • Obtain relationship between intensity and slit width

  • Verify Heisenberg uncertainty principle and Babinet's principle










Introduction

LEOI-31 employs a movable digital photoreceiver to measure the intensity distribution of optical diffraction. With a focus adjustable semiconductor laser, this system can be used to

 

1. observe single-wire/single-slit diffraction

2. measure intensity distribution of optical diffraction

3. confirm the relationship between intensity and wavelength

4. obtain the relationship between intensity and slit width

5. verify Heisenberg uncertainty and Babinet's principles


The instruction manual contains comprehensive materials including experimental configurations, principles and step-by-step instructions. Please click Experiment Theory and Contents to find more information about this apparatus.


Specifications

ItemSpecifications
Semiconductor Laser5 mW @ 650 nm
Diffractive ElementWire, and Single Slit (adjustable width)


Part List

DescriptionQty
Semiconductor Laser (LLL-1)1
Optical Rail1
Carrier2
White Screen (SZ-13)1

Single-Slit with Adjustable Width (SZ-40)

1

Two-Axis Adjustable Laser Holder (SZ-19)

1
Photoreceiver with Amplifier1 each
Transverse Measurement Holder1




LEOI-31 Single-Wire-1.jpg

Fraunhofer diffraction of single slit


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