Data acquired and plotted manually
Graph observed on oscilloscope
Software panel
Note: oscilloscope not included
Features
Stable performance with easy operation
Compact semiconductor laser
CCD & software options
Complete system
Introduction
This apparatus is designed to quantitatively investigate diffraction and interference effects of single-slit, multi-slit, and single-wire. There are three options of the photo-receiving device, i.e. a photo-cell with amplifier (option 1) for manual data acquisition, a linear CCD (option 2) for real-time data display on an oscilloscope, or a linear CCD plus a data acquisition box with software (option 3) for PC use via USB.
The instruction manual contains comprehensive materials including experimental configurations, principles and step-by-step instructions. Please click Experiment Theory and Contents to find more information about this apparatus.
Specifications
| Optical Rail | length: 1.0 m | |
| Semiconductor Laser | 3.0 mW @650 nm | |
Diffraction Element | Single-Slit | slit width: 0.07 mm, 0.10 mm, and 0.12 mm |
| Single-Wire | diameter: 0.10 mm and 0.12 mm | |
| Double-Slit | slit width 0.02 mm , central spacing 0.04 mm | |
| Double-Slit | slit width 0.07 mm , central spacing 0.14 mm | |
| Double-Slit | slit width 0.07 mm , central spacing 0.21 mm | |
| Double-Slit | slit width 0.07 mm , central spacing 0.28 mm | |
| Triple-Slit | slit width 0.02 mm , central spacing 0.04 mm | |
| Quadruple-Slit | slit width 0.02 mm , central spacing 0.04 mm | |
| Pentuple-Slit | slit width 0.02 mm , central spacing 0.04 mm | |
| Photocell Detector (Option 1) | incl 0.1 mm reading ruler & amplifier, connected to a galvanometer | |
| CCD (Option 2) | pixel number: 2700; size: 11×11 μm; spectral range: 0.3~0.9 μm | |
| with synchronization/signal ports, connected to an oscilloscope | ||
| CCD+Software (Option 3) | incl Option 2 | |
| data acquisition box and software for PC use via USB | ||
Data acquired and plotted manually
Graph observed on oscilloscope
Software panel
