Schematic of a Mach-Zehnder interferometer
Schematic of measuring the refractive index of air
Fraunhofer diffraction of a single slit
Fraunhofer diffraction of multiple slits
Schematic of multi-slit diffraction
Verification of Malus's Law
Note: stainless steel optical table or breadboard not provided
Features
Comprehensive experiments
Detailed instruction manual
Easy alignment and setup
Introduction
LEOK-9 is a comprehensive kit including a series of experiments in optical interference, diffraction and polarization. It is developed for general physics education at colleges and universities. It provides a complete set of optical and mechanical components (including light source), which can be conveniently constructed to implement various experiments. Through selecting and assembling individual components into complete experiment setups, students can enhance their experimental skills and problem solving ability. The instruction manual contains comprehensive materials including experimental configurations, principles, step-by-step instructions, and required parts with photos. Please click to view some sample pages of the instruction manual. Using this system, the following experiment examples can be conducted:
Build Interferometers and Observe Interference Patterns
Construct a Michelson interferometer and measure the refractive index of air
Construct a Sagnac interferometer
Construct a Mach-Zehnder interferometer
Set Up Fraunhofer Diffraction and Measure Intensity Distribution
Fraunhofer diffraction through a Single Slit
Fraunhofer diffraction through a Multi-Slit Plate
Fraunhofer diffraction through a Single Circular Aperture
Fraunhofer diffraction through a Transmission Grating
Set Up Fresnel Diffraction and Measure Intensity Distribution
Fresnel diffraction through a Single Slit
Fresnel diffraction through a Multi-Slit Plate
Fresnel diffraction through a Circular Aperture
Fresnel diffraction past a Straight Edge
Measure and Analyze Polarization Status of Light Beams
Brewster's angle measurement of a black glass
Verification of Malus's Law
Function study of a half-wave plate
Function study of a quarter-wave plate: circularly and elliptically polarized light
| Description | Specs/Part # | Qty |
| He-Ne laser | LLL-2 (>2.0 mW@632.8 nm) | 1 |
| Transversal measurement stage | Range: 80 mm; accuracy: 0.01 mm | 1 |
| Magnetic base with post holder | SZ-04 | 3 |
| Two-axis mirror holder | SZ-07 | 2 |
| Lens holder | SZ-08 | 2 |
| Plate holder | SZ-12 | 1 |
| White screen | SZ-13 | 1 |
| Aperture adjustable bar clamp | SZ-19 | 1 |
| Adjustable slit | SZ-40 | 1 |
| Laser tube holder | SZ-42 | 1 |
| Optical goniometer | SZ-47 | 1 |
| Polarizer holder | SZ-51 | 3 |
| Beam splitter | 50/50 | 2 |
| Polarizer | 2 | |
| Half-wave plate | 1 | |
| Quarter-wave plate | 1 | |
| Black glass sheet | 1 | |
| Flat mirror | Φ 36 mm | 2 |
| Lens | f ' = 6.2, 150 mm | 1 each |
| Grating | 20 l/mm | 1 |
| Multiple-slit & multi-hole plate | Single slit: 0.06 & 0.1 mm Multi-slit: 2, 3, 4, 5 (slit width: 0.03 mm; center-to-center: 0.09 mm) Round holes: diameter: 0.05, 0.1, 0.2, 0.3, 0.4, 0.5 mm Square holes: length: 0.05, 0.1, 0.2, 0.3, 0.4, 0.5 mm | 1 |
| Optical rail | 1 m; aluminum | 1 |
| Universal carrier | 2 | |
| X-translation carrier | 2 | |
| X-Z translation carrier | 1 | |
| Air chamber with gauge | 1 | |
| Manual Counter | 4 digits, counts 0 ~ 9999 | 1 |
| Photocurrent amplifier | LLM-1 or LLM-2 | 1 |
Note: a stainless steel optical table or breadboard ≥900 mm x 600 mm) is needed for use with this kit.
Schematic of a Mach-Zehnder interferometer
Schematic of measuring the refractive index of air
Fraunhofer diffraction of a single slit
Fraunhofer diffraction of multiple slits
Schematic of multi-slit diffraction
Verification of Malus's Law
