Fraunhofer diffraction of single slit
Features
Observe single-wire/single-slit diffraction
Measure intensity distribution of diffraction
Confirm relationship between intensity and wavelength
Obtain relationship between intensity and slit width
Verify Heisenberg uncertainty principle and Babinet's principle
Introduction
LEOI-31 employs a movable digital photoreceiver to measure the intensity distribution of optical diffraction. With a focus adjustable semiconductor laser, this system can be used to
1. observe single-wire/single-slit diffraction
2. measure intensity distribution of optical diffraction
3. confirm the relationship between intensity and wavelength
4. obtain the relationship between intensity and slit width
5. verify Heisenberg uncertainty and Babinet's principles
The instruction manual contains comprehensive materials including experimental configurations, principles and step-by-step instructions. Please click Experiment Theory and Contents to find more information about this apparatus.
Specifications
| Item | Specifications |
| Semiconductor Laser | 5 mW @ 650 nm |
| Diffractive Element | Wire, and Single Slit (adjustable width) |
Part List
| Description | Qty |
| Semiconductor Laser (LLL-1) | 1 |
| Optical Rail | 1 |
| Carrier | 2 |
| White Screen (SZ-13) | 1 |
Single-Slit with Adjustable Width (SZ-40) | 1 |
Two-Axis Adjustable Laser Holder (SZ-19) | 1 |
| Photoreceiver with Amplifier | 1 each |
| Transverse Measurement Holder | 1 |
Fraunhofer diffraction of single slit
