Physics Lab Equipment

LEEI-62 Interference, Diffraction & Polarization of Microwave- Advanced Model

LEEI-62 Interference, Diffraction & Polarization of Microwave- Advanced Model

Features

  • Advanced microwave study

  • Comprehensive experimentation

  • Enhanced features

  • Quantitative analysis 



Introduction


Microwaves and light waves, as electromagnetic waves, exhibit shared phenomena such as reflection, refraction, polarization, interference, and diffraction. However, due to the significantly longer wavelength of microwaves (approximately 4 orders of magnitude larger than visible light), their experimental setups and observed phenomena differ.  


The LEEI-62 Microwave Experimental System provides an advanced platform for studying the interference, diffraction, and polarization of microwaves. This system incorporates a microwave transmitter with a variable attenuator, a microwave detector with a meter display, transmitting and receiving horns, and various accessories, such as single slits, double slits, a beam splitter, and a crystal model. It enables quantitative analysis and in-depth exploration of multiple wave phenomena.  


Using this apparatus, students can perform the following experiments:  


1. Verify the Law of Reflection: Investigate the reflection properties of electromagnetic waves.  

2. Measure Intensity Distribution of Single-Slit Diffraction: Analyze how microwaves diffract through a single slit.  

3. Measure Intensity Distribution of Double-Slit Interference: Examine interference patterns created by double slits.  

4. Determine Microwave Wavelength: Use a Michelson interferometer to measure the wavelength of microwaves.  

5. Study Polarization: Observe polarization properties and verify Malus' Law.  

6. Verify Bragg Diffraction: Study diffraction patterns using a crystal model.  


The instruction manual provides detailed explanations of experimental setups, theoretical principles, step-by-step procedures, and sample results to ensure precise and reliable outcomes for advanced educational applications. Please click Experiment Contents and Results to find more information about this apparatus.


Specifications

ItemSpecifications
FrequencyRange: 8.6~9.6 GHz; draft: ± 5×10-4/15-min; display error: ±40 MHz
Output power>20 mW
Working voltageDC 12 V
Wave formEqual amplitude
Internal modulationSquare-wave at 1 kHz
Output waveguide dimensionsInner: 22.86 mm × 10.16 mm
Standing-wave coefficient≤ 1.2 (synthesis voltage)
Output microwave wavelengthλ =32.02 mm (factory preset)
Horn antennaGain ~ 20 dB; lobe width H 200 & E 160


Part List

DescriptionQty
3-cm solid state microwave signal source1
Base1
Platform1
Fixed arm1
Horn antenna2
Variable attenuator1
Crystal detector1
Indicator meter1
Video cable1
Reflection plate (aluminum)1
Single-slit plate (slit width adjustable)1
Double-slit plate (slit width adjustable; barrier=50 mm)1
Partial transparent plate (glass)1
Simulated crystal with support1
Translation stage1
Support base1
Support post4
Module piece1
Screws and nuts1 set
Instruction manual1

LEEI-62 Interference-1.jpg

Diffraction distribution of single slit


LEEI-62 Interference-2.jpg

Interference of double slits


LEEI-62 Interference-3.jpg

Bragg diffraction


LEEI-62 Interference-4.jpg

Malus' law

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