Physics Lab Equipment

LEOI-58 Serial Experiments on Semiconductor Laser

LEOI-58 Serial Experiments on Semiconductor Laser

Note: computer not included

Features

  • Observe spectral curve of semiconductor laser with CCD array spectrometer

  • Understand optical characteristics of semiconductor laser

  • Measure basic parameters of semiconductor laser such as divergence angle and degree of polarization

  • Complete system





Introduction


The LEOI-58 system is designed to measure and analyze the characteristics of semiconductor lasers. The system focuses on evaluating output power, driving voltage and current under continuous wave (CW) operation, helping students understand the working behavior of semiconductor lasers in these conditions. The system is equipped with a CCD array spectrometer (optical multi-channel analyzer), which is used to monitor the fluorescence spectrum of the laser when the injection current is below the threshold. Additionally, it tracks spectral variations when the injection current exceeds the threshold current, leading to laser oscillation.


Using the LEOI-58 system, students can perform the following measurements and experiments to better understand the operation of semiconductor lasers:


1. Output Power Characterization:

   Measure and characterize the output power of the semiconductor laser. Students can observe how power output changes with variations in injection current and analyze the efficiency of the laser.


2. Divergent Angle Measurement:

   Measure the divergence angle of the laser beam to understand how the laser's beam spreads as it propagates. This experiment helps students understand beam propagation and beam quality.


3. Degree of Polarization Measurement:

   Measure the degree of polarization of the output laser beam to understand the polarization characteristics of the semiconductor laser. This experiment highlights the importance of polarization in laser applications.


4. Spectral Characterization:

   Perform spectral characterization of the semiconductor laser to monitor its emission spectrum. Using the CCD array spectrometer, students can analyze the fluorescence spectrum and observe changes when the injection current is adjusted.


The instruction manual contains comprehensive materials including experimental configurations, principles and step-by-step instructions. Please click Experiment Theory and Contents to find more information about this apparatus.


Specifications

ItemSpecifications


Semiconductor Laser 

Output Power< 5 mW
Center Wavelength: 650 nm

Semiconductor Laser Driver

0 ~ 40 mA (continuously adjustable)

CCD Array Spectrometer

Wavelength Range: 300 ~ 900 nm
Grating: 600 L/mm
Focal Length: 302.5 mm
Rotary Polarizer Holder Minimum Scale: 1°

Rotary Stage

0 ~ 360°, Minimum Scale: 1°
Multi-Function Optical Elevating TableElevating Range>40 mm

Optical Power Meter 

2 µW ~ 200 mW, 6 scales


Part List

DescriptionQty
CCD Array Spectrometer (LEOI-100)1
650-nm Semiconductor Laser (LLL-1)2
Semiconductor Laser Driver1
Focusing Lens with Holder1 each
Four-Axis Adjustable Holder (SZ-24)1
Two-Axis Adjustable Holder (SZ-06)1
Multi-Function Optical Elevating Platform1
Optical Goniometer (SZ-47)1
Rotary Polarizer Holder (SZ-51)1
Polarizer1
Attenuator1
White Screen (SZ-13)1
Optical Power Meter with Detector Head1 set
Software CD (Windows 7, 32/64-Bit PCs)1


LEOI-58 Serial Experiments-1.jpg

Setup for P-I curve measurement


LEOI-58 Serial Experiments-2.jpg

Setup for beam divergence measurement


LEOI-58 Serial Experiments-3.jpg

Setup for polarization measurement


LEOI-58 Serial Experiments-4.jpg

Setup for spectral characterization


Copyright © Lambda Scientific Systems, Inc. 2010-2025. All rights reserved.