Setup for P-I curve measurement
Setup for beam divergence measurement
Setup for polarization measurement
Setup for spectral characterization
Note: computer not included
Features
Observe spectral curve of semiconductor laser with CCD array spectrometer
Understand optical characteristics of semiconductor laser
Measure basic parameters of semiconductor laser such as divergence angle and degree of polarization
Complete system
Introduction
The LEOI-58 system is designed to measure and analyze the characteristics of semiconductor lasers. The system focuses on evaluating output power, driving voltage and current under continuous wave (CW) operation, helping students understand the working behavior of semiconductor lasers in these conditions. The system is equipped with a CCD array spectrometer (optical multi-channel analyzer), which is used to monitor the fluorescence spectrum of the laser when the injection current is below the threshold. Additionally, it tracks spectral variations when the injection current exceeds the threshold current, leading to laser oscillation.
Using the LEOI-58 system, students can perform the following measurements and experiments to better understand the operation of semiconductor lasers:
1. Output Power Characterization:
Measure and characterize the output power of the semiconductor laser. Students can observe how power output changes with variations in injection current and analyze the efficiency of the laser.
2. Divergent Angle Measurement:
Measure the divergence angle of the laser beam to understand how the laser's beam spreads as it propagates. This experiment helps students understand beam propagation and beam quality.
3. Degree of Polarization Measurement:
Measure the degree of polarization of the output laser beam to understand the polarization characteristics of the semiconductor laser. This experiment highlights the importance of polarization in laser applications.
4. Spectral Characterization:
Perform spectral characterization of the semiconductor laser to monitor its emission spectrum. Using the CCD array spectrometer, students can analyze the fluorescence spectrum and observe changes when the injection current is adjusted.
The instruction manual contains comprehensive materials including experimental configurations, principles and step-by-step instructions. Please click Experiment Theory and Contents to find more information about this apparatus.
Specifications
Item | Specifications |
Semiconductor Laser | Output Power< 5 mW |
Center Wavelength: 650 nm | |
Semiconductor Laser Driver | 0 ~ 40 mA (continuously adjustable) |
CCD Array Spectrometer | Wavelength Range: 300 ~ 900 nm |
Grating: 600 L/mm | |
Focal Length: 302.5 mm | |
Rotary Polarizer Holder | Minimum Scale: 1° |
Rotary Stage | 0 ~ 360°, Minimum Scale: 1° |
Multi-Function Optical Elevating Table | Elevating Range>40 mm |
Optical Power Meter | 2 µW ~ 200 mW, 6 scales |
Part List
Description | Qty |
CCD Array Spectrometer (LEOI-100) | 1 |
650-nm Semiconductor Laser (LLL-1) | 2 |
Semiconductor Laser Driver | 1 |
Focusing Lens with Holder | 1 each |
Four-Axis Adjustable Holder (SZ-24) | 1 |
Two-Axis Adjustable Holder (SZ-06) | 1 |
Multi-Function Optical Elevating Platform | 1 |
Optical Goniometer (SZ-47) | 1 |
Rotary Polarizer Holder (SZ-51) | 1 |
Polarizer | 1 |
Attenuator | 1 |
White Screen (SZ-13) | 1 |
Optical Power Meter with Detector Head | 1 set |
Software CD (Windows 7, 32/64-Bit PCs) | 1 |
Setup for P-I curve measurement
Setup for beam divergence measurement
Setup for polarization measurement
Setup for spectral characterization