Fringes after applying magnetic field
Fringe analyzing software
Fringes at 436 nm before and after applying magnetic field
Fringes at 577 nm before and after applying magnetic field
Features
Transverse and longitudinal Zeeman effects
Adjustable magnetic field intensity from electromagnet
Large magnet pole for uniform interference pattern
Wideband etalon allowing oberservation of Zeeman effects at multiple Hg wavelengths
Optional CCD camera with analysis software for Windows 10/11
Introduction
Zeeman effect experiment is important in modern physics to confirm the existence of atomic magnetic moment and spatial quantization. It can be used to determine atomic energy levels and g factor, and verify the theory of electron spin.
This LEAI-21A Zeeman effect experimental apparatus uses an electromagnet to split the spectral line of Mercury at 546.1 nm to generate π and σ lines. A direct reading microscope is used to measure the interference pattern from a F-P etalon. The axial hole on one magnet pole allows the Mercury light to propagate in the longitudinal direction, so both transverse and longitudinal Zeeman effects can be observed by using this apparatus. An optional CCD with analytical software can be used to acquire and analyze the interference pattern to calculate the Bohr magneton. In addition, the wideband etalon allows the observation of Zeeman effect at other Mercury spectral lines of 577 nm, 436 nm and 404 nm with an optional set of filters.
The instruction manual contains comprehensive materials including experimental configurations, principles and step-by-step instructions. Please click Experiment Theory and Contents to find more information about this apparatus.
Using this instrument, the following experiments can be conducted:
1. Understand atomic magnetic moment and spatial quantization in atomic physics
2. Observe transverse and longitudinal Zeeman effects of Mercury at 546.1 nm
3. Observe the splitting and the polarization of a Mercury spectral line at 546.1 nm
4. Determine the electron charge-mass ratio (e/m) based on Zeeman splitting amount.
Specifications
| Item | Specifications |
| Electromagnet | intensity: >1000 mT; pole: spacing 8 mm, dia 30 mm; axial aperture: 5 mm |
| Power supply of electromagnet | 5 A/30 V (max) |
| Etalon | solid gap, material optical quartz, refractive index 1.46 @ 546.1 nm, aperture 26 mm, thickness 1.4 mm; passband: >100 nm; R= 95%; flatness:< λ/30 |
| Teslameter | range 0-1999 mT; resolution 1 mT |
| Pencil mercury lamp | emitter diameter 6.5 mm; starting voltage 1500 V, power 3 W |
| Interference optical filter | CWL 546.1 nm; half passband 8 nm; aperture 19 mm |
| Direct reading microscope | magnification: 20 X; range 6 mm; resolution 0.01 mm |
| Polarizer | aperture 20 mm, rotation 0 - 360°, resolution 1° |
| Lenses | 2 pieces, dia 34 mm |
| Optical rail | length 500 mm, scale division 1 mm |
Parts List
| Description | Qty |
| Main Electric Unit | 1 |
| Pencil Mercury Lamp | 1 |
| Milli-Teslameter Probe | 1 |
| Optical Rail | 1 |
| Carrier Slide | 4 |
| Power Supply of Electromagnet | 1 |
| Electromagnet | 1 |
| Polarizer | 1 |
| Interference Filter | 1 |
| F-P Etalon | 1 |
| 1/4 Wave Plate | 1 |
| Lens | 2 |
| Direct Reading Microscope | 1 |
| Power Cord | 1 |
| Instruction Manual | 1 |
| CCD, USB Interface & Software | 1 set (optional) |
Fringes after applying magnetic field
Fringe analyzing software
Fringes at 436 nm before and after applying magnetic field
Fringes at 577 nm before and after applying magnetic field
